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1

[IEEE 2012 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2012.11.5-2012.11.8)] 2012 IEEE International Test Conference - FPGA-based synthetic instrumentation for board test

Aleksejev, Igor, Jutman, Artur, Devadze, Sergei, Odintsov, Sergei, Wenzel, Thomas

Année:

2012

Langue:

english

Fichier:

PDF, 937 KB

english, 2012

2

[IEEE 2012 17th IEEE European Test Symposium (ETS) - Annecy, France (2012.05.28-2012.05.31)] 2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - Embedded synthetic instruments for Board-Level testing

Jutman, Artur, Devadze, Sergei, Aleksejev, Igor, Wenzel, Thomas

Année:

2012

Langue:

english

Fichier:

PDF, 159 KB

english, 2012

3

[IEEE 2015 IEEE International Symposium on Circuits and Systems (ISCAS) - Lisbon, Portugal (2015.5.24-2015.5.27)] 2015 IEEE International Symposium on Circuits and Systems (ISCAS) - Combinational fault simulation in sequential circuits

Ubar, Raimund, Kousaar, Jaak, Gorev, Maksim, Devadze, Sergei

Année:

2015

Langue:

english

Fichier:

PDF, 413 KB

english, 2015

4

Optimization of Boundary Scan Tests Using FPGA-Based Efficient Scan Architectures

Aleksejev, Igor, Devadze, Sergei, Jutman, Artur, Shibin, Konstantin

Journal:

Journal of Electronic Testing

Année:

2016

Langue:

english

Fichier:

PDF, 567 KB

english, 2016

5

[IEEE 2019 IEEE 25th International Symposium on On-Line Testing And Robust System Design (IOLTS) - Rhodes, Greece (2019.7.1-2019.7.3)] 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS) - Application Specific True Critical Paths Identification in Sequential Circuits

Jurimagi, Lembit, Ubar, Raimund, Jenihhin, Maksim, Raik, Jaan, Devadze, Sergei, Oyeniran, Adeboye Stephen

Année:

2019

Fichier:

PDF, 302 KB

2019

6

[IEEE 2009 IEEE International Test Conference (ITC) - Austin, TX, USA (2009.11.1-2009.11.6)] 2009 International Test Conference - Fast extended test access via JTAG and FPGAs

Devadze, Sergei, Jutman, Artur, Aleksejev, Igor, Ubar, Raimund

Année:

2009

Langue:

english

Fichier:

PDF, 227 KB

english, 2009

7

[IEEE 2009 10th Latin American Test Workshop - Rio de Janeiro, Brazil (2009.03.2-2009.03.5)] 2009 10th Latin American Test Workshop - Turning JTAG inside out for fast extended test access

Devadze, Sergei, Jutman, Artur, Aleksejev, Igor, Ubar, Raimund

Année:

2009

Langue:

english

Fichier:

PDF, 247 KB

english, 2009

8

[IEEE 2013 NORCHIP - Vilnius, Lithuania (2013.11.11-2013.11.12)] 2013 NORCHIP - At-speed self-testing of high-performance pipe-lined processing architectures

Gorev, Maksim, Ubar, Raimund, Ellervee, Peeter, Devadze, Sergei, Raik, Jaan, Min, Mart

Année:

2013

Langue:

english

Fichier:

PDF, 505 KB

english, 2013

9

[IEEE 2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications - Ho Chi Minh City, Vietnam (2010.01.13-2010.01.15)] 2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications - Fast Fault Simulation for Extended Class of Faults in Scan Path Circuits

Ubar, Raimund, Devadze, Sergei, Raik, Jaan, Jutman, Artur

Année:

2010

Langue:

english

Fichier:

PDF, 344 KB

english, 2010

10

[IEEE 2008 Asia and South Pacific Design Automation Conference (ASPDAC) - Seoul, South Korea (2008.03.21-2008.03.24)] 2008 Asia and South Pacific Design Automation Conference - Parallel fault backtracing for calculation of fault coverage

Ubar, Raimund, Devadze, Sergei, Raik, Jaan, Jutman, Artur

Année:

2008

Langue:

english

Fichier:

PDF, 134 KB

english, 2008

11

[IEEE 2008 NORCHIP - Tallin, Estonia (2008.11.16-2008.11.17)] 2008 NORCHIP - Microprocessor-based System Test using Debug Interface

Devadze, Sergei, Jutman, Artur, Tsertov, Anton, Instenberg, Martin, Ubar, Raimund

Année:

2008

Langue:

english

Fichier:

PDF, 94 KB

english, 2008

12

[IEEE 2011 IEEE 20th Asian Test Symposium (ATS) - New Delhi, India (2011.11.20-2011.11.23)] 2011 Asian Test Symposium - Automatic SoC Level Test Path Synthesis Based on Partial Functional Models

Tsertov, Anton, Ubar, Raimund, Jutman, Artur, Devadze, Sergei

Année:

2011

Langue:

english

Fichier:

PDF, 331 KB

english, 2011

13

[IEEE 2014 IEEE 23rd North Atlantic Test Workshop (NATW) - Johnson City, NY, USA (2014.5.14-2014.5.16)] 2014 IEEE 23rd North Atlantic Test Workshop - Asynchronous Fault Detection in IEEE P1687 Instrument Network

Shibin, Konstantin, Devadze, Sergei, Jutman, Artur

Année:

2014

Langue:

english

Fichier:

PDF, 173 KB

english, 2014

14

[IEEE 12th IEEE European Test Symposium - Freiburg, Germany (2007.05.20-2007.05.24)] 12th IEEE European Test Symposium (ETS'07) - Ultra Fast Parallel Fault Analysis on Structurally Synthesized BDDs

Ubar, Raimund, Devadze, Sergei, Raik, Jaan, Jutman, Artur

Année:

2007

Langue:

english

Fichier:

PDF, 227 KB

english, 2007

15

Effective Scalable IEEE 1687 Instrumentation Network for Fault Management

Jutman, Artur, Devadze, Sergei, Shibin, Konstantin

Journal:

IEEE Design and Test

Année:

2013

Langue:

english

Fichier:

PDF, 783 KB

english, 2013

16

Functional self-test of high-performance pipe-lined signal processing architectures

Gorev, Maksim, Ubar, Raimund, Ellervee, Peeter, Devadze, Sergei, Raik, Jaan, Min, Mart

Journal:

Microprocessors and Microsystems

Année:

2014

Langue:

english

Fichier:

PDF, 2.04 MB

english, 2014

17

[IEEE 2014 17th Euromicro Conference on Digital System Design (DSD) - Verona, Italy (2014.8.27-2014.8.29)] 2014 17th Euromicro Conference on Digital System Design - Critical Path Tracing Based Simulation of Transition Delay Faults

Kousaar, Jaak, Ubar, Raimund, Devadze, Sergei, Raik, Jaan

Année:

2014

Langue:

english

Fichier:

PDF, 271 KB

english, 2014

18

[IEEE 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) - Hong Kong, China (2008.01.23-2008.01.25)] 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) - Hierarchical Calculation of Malicious Faults for Evaluating the Fault-Tolerance

Ubar, Raimund, Devadze, Sergei, Jenihhin, Maksim, Raik, Jaan, Jervan, Gert, Ellervee, Peeter

Année:

2008

Langue:

english

Fichier:

PDF, 488 KB

english, 2008

19

[IEEE Technology of Integrated Systems in Nanoscal Era (DTIS) - Cairo, Egypt (2009.04.6-2009.04.9)] 2009 4th International Conference on Design & Technology of Integrated Systems in Nanoscal Era - Parallel exact critical path tracing fault simulation with reduced memory requirements

Devadze, Sergei, Ubar, Raimund, Raik, Jaan, Jutman, Artur

Année:

2009

Langue:

english

Fichier:

PDF, 350 KB

english, 2009

20

[IEEE 2011 14th Euromicro Conference on Digital System Design (DSD) - Oulu, Finland (2011.08.31-2011.09.2)] 2011 14th Euromicro Conference on Digital System Design - SoC and Board Modeling for Processor-Centric Board Testing

Tsertov, Anton, Ubar, Raimund, Jutman, Artur, Devadze, Sergei

Année:

2011

Langue:

english

Fichier:

PDF, 708 KB

english, 2011

21

[IEEE 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Dresden (2010.03.8-2010.03.12)] 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Parallel X-fault simulation with critical path tracing technique

Ubar, Raimund, Devadze, Sergei, Raik, Jaan, Jutman, Artur

Année:

2010

Langue:

english

Fichier:

PDF, 250 KB

english, 2010

22

[IEEE 2010 13th Euromicro Conference on Digital System Design: Architectures, Methods and Tools (DSD) - Lille, France (2010.09.1-2010.09.3)] 2010 13th Euromicro Conference on Digital System Design: Architectures, Methods and Tools - Structurally Synthesized Multiple Input BDDs for Speeding Up Logic-Level Simulation of Digital Circuits

Mironov, Dmitri, Ubar, Raimund, Devadze, Sergei, Raik, Jaan, Jutman, Artur

Année:

2010

Langue:

english

Fichier:

PDF, 573 KB

english, 2010

23

[IEEE 2014 IEEE 23rd Asian Test Symposium (ATS) - Hangzhou, China (2014.11.16-2014.11.19)] 2014 IEEE 23rd Asian Test Symposium - Design, Verification, and Application of IEEE 1687

Zadegan, Farrokh Ghani, Larsson, Erik, Jutman, Artur, Devadze, Sergei, Krenz-Baath, Rene

Année:

2014

Langue:

english

Fichier:

PDF, 347 KB

english, 2014

24

Transition delay fault simulation with parallel critical path back-tracing and 7-valued algebra

Kõusaar, Jaak, Ubar, Raimund, Devadze, Sergei, Raik, Jaan

Journal:

Microprocessors and Microsystems

Année:

2015

Langue:

english

Fichier:

PDF, 1.09 MB

english, 2015

25

[IEEE 2015 16th Latin-American Test Symposium (LATS) - Puerto Vallarta, Mexico (2015.3.25-2015.3.27)] 2015 16th Latin-American Test Symposium (LATS) - Virtual reconfigurable scan-chains on FPGAs for optimized board test

Aleksejev, Igor, Devadze, Sergei, Jutman, Artur, Shibin, Konstantin

Année:

2015

Langue:

english

Fichier:

PDF, 525 KB

english, 2015

26

[IEEE 2011 IEEE International Conference on Computer Science and Automation Engineering (CSAE) - Shanghai, China (2011.06.10-2011.06.12)] 2011 IEEE International Conference on Computer Science and Automation Engineering - Digital logic simulation with compressed BDDs

Ubar, Raimund, Mironov, Dmitri, Devadze, Sergei, Raik, Jaan, Jutman, Artur

Année:

2011

Langue:

english

Fichier:

PDF, 114 KB

english, 2011

27

[IEEE Conference Publications Design, Automation and Test in Europe - Grenoble, France (2015.03.9-2015.03.13)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015 - Fault Simulation with Parallel Exact Critical Path Tracing in Multiple Core Environment

Gorev, Maksim, Ubar, Raimund, Devadze, Sergei

Année:

2015

Langue:

english

Fichier:

PDF, 441 KB

english, 2015

28

[IEEE 2016 17th Latin-American Test Symposium (LATS) - Foz do Iguacu (2016.4.6-2016.4.8)] 2016 17th Latin-American Test Symposium (LATS) - On-line fault classification and handling in IEEE1687 based fault management system for complex SoCs

Shibin, Konstantin, Devadze, Sergei, Jutman, Artur

Année:

2016

Langue:

english

Fichier:

PDF, 2.08 MB

english, 2016

29

[IEEE 2016 IEEE AUTOTESTCON - Anaheim, CA, USA (2016.9.12-2016.9.15)] 2016 IEEE AUTOTESTCON - Reliable health monitoring and fault management infrastructure based on embedded instrumentation and IEEE 1687

Jutman, Artur, Shibin, Konstantin, Devadze, Sergei

Année:

2016

Langue:

english

Fichier:

PDF, 1.02 MB

english, 2016

30

[IEEE 2016 IEEE International Test Conference (ITC) - Fort Worth, TX, USA (2016.11.15-2016.11.17)] 2016 IEEE International Test Conference (ITC) - A suite of IEEE 1687 benchmark networks

Tsertov, Anton, Jutman, Artur, Devadze, Sergei, Reorda, Matteo Sonza, Larsson, Erik, Zadegan, Farrokh Ghani, Cantoro, Riccardo, Montazeri, Mehrdad, Krenz-Baath, Rene

Année:

2016

Langue:

english

Fichier:

PDF, 768 KB

english, 2016

31

[IEEE 2016 IEEE AUTOTESTCON - Anaheim, CA, USA (2016.9.12-2016.9.15)] 2016 IEEE AUTOTESTCON - Run-time reconfigurable instruments for advanced board-level testing

Aleksejev, Igor, Jutman, Artur, Devadze, Sergei

Année:

2016

Langue:

english

Fichier:

PDF, 570 KB

english, 2016

32

[IEEE 2016 Forum on Specification and Design Languages (FDL) - Bremen, Germany (2016.9.14-2016.9.16)] 2016 Forum on Specification and Design Languages (FDL) - Designing reliable cyber-physical systems overview associated to the special session at FDL'16

Aleksandrowicz, Gadi, Arbel, Eli, Bloem, Roderick, Braak, Timon Ter, Devadze, Sergei, Fey, Goerschwin, Jenihhin, Maksim, Jutman, Artur, Kerkhoff, Hans G., Konighofer, Robert, Malburg, Jan, Moran, Shir

Année:

2016

Langue:

english

Fichier:

PDF, 2.23 MB

english, 2016

33

Run-time reconfigurable instruments for advanced board-level testing

Aleksejev, Igor, Jutman, Artur, Devadze, Sergei

Journal:

IEEE Instrumentation & Measurement Magazine

Année:

2017

Langue:

english

Fichier:

PDF, 451 KB

english, 2017

34

[IEEE 2017 IEEE International Test Conference (ITC) - Fort Worth, TX (2017.10.31-2017.11.2)] 2017 IEEE International Test Conference (ITC) - Marginal PCB assembly defect detection on DDR3/4 memory bus

Odintsov, Sergei, Jutman, Artur, Devadze, Sergei

Année:

2017

Langue:

english

Fichier:

PDF, 514 KB

english, 2017

35

[IEEE 2017 IEEE AUTOTESTCON - Schaumburg, IL, USA (2017.9.9-2017.9.15)] 2017 IEEE AUTOTESTCON - Embedded instrumentation toolbox for screening marginal defects and outliers for production

Odintsov, Sergei, Jutman, Artur, Devadze, Sergei, Aleksejev, Igor

Année:

2017

Langue:

english

Fichier:

PDF, 1.35 MB

english, 2017

36

Health Management for Self-Aware SoCs Based on IEEE 1687 Infrastructure

Shibin, Konstantin, Devadze, Sergei, Jutman, Artur, Grabmann, Martin, Pricken, Robin

Journal:

IEEE Design and Test

Année:

2017

Langue:

english

Fichier:

PDF, 1.42 MB

english, 2017

37

[IEEE 2018 25th International Conference "Mixed Design of Integrated Circuits and System" (MIXDES) - Gdynia, Poland (2018.6.21-2018.6.23)] 2018 25th International Conference "Mixed Design of Integrated Circuits and System" (MIXDES) - Parallel Critical Path Tracing Fault Simulation in Sequential Circuits

Kousaar, Jaak, Ubar, Raimund, Kostin, Sergei, Devadze, Sergei, Raik, Jaan

Année:

2018

Fichier:

PDF, 530 KB

2018

38

[IEEE 2018 IEEE AUTOTESTCON - National Harbor, MD (2018.9.17-2018.9.20)] 2018 IEEE AUTOTESTCON - IEEE 1687 Compliant Ecosystem for Embedded Instrumentation Access and In-Field Health Monitoring

Tsertov, Anton, Jutman, Artur, Shibin, Konstantin, Devadze, Sergei

Année:

2018

Fichier:

PDF, 9 KB

2018

39

[IEEE 2019 IEEE 25th International Symposium on On-Line Testing And Robust System Design (IOLTS) - Rhodes, Greece (2019.7.1-2019.7.3)] 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS) - Application Specific True Critical Paths Identification in Sequential Circuits

Jurimagi, Lembit, Ubar, Raimund, Jenihhin, Maksim, Raik, Jaan, Devadze, Sergei, Oyeniran, Adeboye Stephen

Année:

2019

Fichier:

PDF, 302 KB

2019

40

[IEEE 2019 IEEE AUTOTESTCON - National Harbor, MD, USA (2019.8.26-2019.8.29)] 2019 IEEE AUTOTESTCON - Ways for board and system test to benefit from FPGA embedded instrumentation

Ehrenberg, Heiko, Odintsov, Sergei, Devadze, Sergei, Jutman, Artur, Aleksejev, Igor, Wenzel, Thomas

Année:

2019

Fichier:

PDF, 611 KB

2019